Reference: RBD-1354
Jumper Wire Single 20cm
Length: 8 inches/20 CM (Long) Material: Copper Plated Pin Spacing: 2.54mm.
Reference: RBD-1354
Length: 8 inches/20 CM (Long) Material: Copper Plated Pin Spacing: 2.54mm.
Reference: RBD-0351
Contactless transmission of data and supply energy (no battery needed) Operating distance: Up to 100mm (depending on antenna geometry) RoboticsBD Operating frequency: 13.56MHz Data transfer: 106 kbit/s Data integrity: 16 Bit CRC, parity, bit coding bit counting Anticollision Typical ticketing transaction: <100 ms ( including backup management)...
Reference: 0245
Choose your desire Resistor value from below:
Reference: 0031
3 Types Available (Please select from option) 1. Male to Male 2. Male to Female 3. Female-Female
Reference: RBD-0768
Size: 5mm Color: RED Head Shape: Round Lens Appearance: Transparent
Reference: RBD-0761
Breadboard friendly Mounting Style: Through Hole Mounting Direction: Vertical
Reference: 1353
Length: 12.5 inches/30 CM (Long) Material: Copper Plated Pin Spacing: 2.54mm.
Subcategories
Reference: RBD-1236
Ergonomic exterior, comfortable handling Large, multiple angle HD display Quick, auto calculation with real-time readout Multiple functions Auto power off after 3 minutes without operation
Reference: RBD-1829
0-9999 Ohm Simple Resistance Box Precision Variable Decade Resistor Instrument PT-100 Simulator Can be used to simulate PT-100 Sensor for calibration purpose
Reference: RBD-2009
Digital Auto Counter Meter with Hall Effect Proximity Switch Sensor (Battery Powered) No Power Required Digital Counter Meter Battery Attached Hall Effect Proximity Switch Sensor Connect Hall Effect Proximity Switch Sensor 2 wire to counter terminals 1&2. If the sensor detects a magnet it will start to count.
Reference: RBD-2556
The TES210 is a digital integration tester designed primarily for testing 74 series and 40 series digital ICs, capable of testing more than 200 types of IC. Its user-friendly interface facilitates easy testing, and its measurement of logic IC allows the identification of malfunctioning logic gates during the integration testing process.